Our Products

Manganese Tin Alloy Sputtering Target

Manganese Tin Alloy Sputtering Target

Manganese Tin Alloy Sputtering Target
Product No NRE-43649
CAS No. 7439-96-5 / 7440-31-5
Formula Mn3Sn
Molecular Weight 283.52
Purity 99.95%
Density NA
Thickness 3 mm ± 0.5mm (can be customized)
Diameter 50 mm ± 1mm (can be customized)
Shape Round
Resistivity NA
Thermal Conductivity NA

Manganese Tin Alloy Sputtering Target

Introduction

Manganese tin (Mn-Sn) alloy sputtering targets are materials used in the deposition of thin films, valued for their unique combination of properties. This alloy exhibits excellent mechanical strength, corrosion resistance, and magnetic characteristics, making it suitable for various advanced applications in electronics and materials science.

Applications

Magnetic Materials:

Mn-Sn alloys are used to create magnetic thin films, which are essential for applications in data storage devices and magnetic sensors.

Semiconductor Devices:

Employed in the fabrication of thin films for semiconductor applications, such as transistors and diodes, due to their electrical conductivity and favorable electronic properties.

Optoelectronic Devices:

Utilized in the production of light-emitting diodes (LEDs) and photodetectors, benefiting from their unique optical properties.

Battery Technology:

Manganese tin alloys can be used in developing battery materials, contributing to improved performance in energy storage applications.

Surface Coatings:

Applied as protective coatings in various industries, enhancing wear resistance and durability in tools and components exposed to harsh environments.

Conclusion

Manganese tin alloy sputtering targets are significant materials in the fields of electronics, magnetics, and energy storage. Their unique properties enable a range of applications, making them valuable in modern manufacturing and research. As technology continues to advance, the demand for these alloys in innovative applications is likely to grow, highlighting their importance in various industries.

 

 

error: